RF Phase Error Built-In-Self-Test for A GSM SOC

Vol.1 No.4

Year: 2008

Issue: Apr-Jun

Title: RF Phase Error Built-In-Self-Test for A GSM SOC 

Author Name: Dallas Webster, Loi Phan , Oren Eliezer , Rick Hudgens , Donald Lie 

Synopsis: 

This paper presents a novel RF Built-in-Self-Test (RF-BiST) targeting to replace the traditionally expensive and time-consuming RF parametric phase error test on a GSM Digital Radio Processor (DRP) radio transceiver. The verification of the RF BiST in a production environment and a comparison of the internal BiST with two alternative external tests is presented, validating the RF BiST as an acceptable test method for determining the phase error of GSM devices. The results illustrate that there are great opportunities in reduction of test time and costs by moving to the internal digital method of the presented BiST for testing RF/analog IC products

.

 

.